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74LVC2G74GT,115 is a single positive edge triggered D-type flip-flop with individual data (D), clock (CP), set (active-low SD) and reset (active-low RD) inputs, and complementary Q and active-low Q outputs. Data at the D-input that meets the set-up and hold time requirements on the LOW-to-HIGH clock transition will be stored in the flip-flop and appear at the Q output. Inputs can be driven from either 3.3V or 5V devices. This feature allows the use of this device as translator in mixed 3.3V and 5V environments. Schmitt-trigger action at all inputs makes the circuit tolerant of slower input rise and fall times. This device is fully specified for partial power down applications using IOFF. The IOFF circuitry disables the output, preventing the potentially damaging backflow current through the device when it is powered down. It features ESD protection (HBM: ANSI/ESDA/JEDEC JS-001 class 2 exceeds 2000V, CDM: ANSI/ESDA/JEDEC JS-002 class C3 exceeds 1000V).
- Wide supply voltage range from 1.65V to 5.5V
- Overvoltage tolerant inputs to 5.5V, high noise immunity
- Complies with JEDEC standard, CMOS low power consumption
- Latch-up performance exceeds 250mA, direct interface with TTL levels
- IOFF circuitry provides partial power-down mode operation
- Input leakage current is ±0.1μA typ at (VI= 5.5V or GND;VCC = 0V to 5.5V, -40°C to +85°C)
- Supply current is 0.1μA typ at (VI = 5.5V or GND;VCC = 1.65V to 5.5V;IO = 0A, -40°C to +85°C)
- Input capacitance is 4pF typical at (-40°C to +85°C)
- Propagation delay is 6ns typ at (VCC = 1.65V to 1.95V, -40°C to +85°C)
- Operating temperature range from -40°C to +125°C, XSON8 package
Hoiatused
Market demand for this product has caused an extension in leadtimes. Delivery dates may fluctuate. Product exempt from discounts.
Tehnilised andmed
74LVC2G74
6ns
-
XSON
Positive Edge
1.65V
74LVC
-40°C
-
MSL 1 - Unlimited
D
280MHz
XSON
8Pins
Complementary
5.5V
742G74
125°C
-
No SVHC (21-Jan-2025)
Tehnilised dokumendid (2)
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Riik, kus toimus viimane oluline tootmisprotsessPäritoluriik:Thailand
Riik, kus toimus viimane oluline tootmisprotsess
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